Gold
                  Assay of Gold - 
       
By X-Ray Fluoresce Technology 

 

Assay of Gold

The GoldArt products are manufactured in Top manufactory in P.R. China. Its gold content and gold thickness were assayed by the National Center of Testing Technology, Shanghai – The national-level analysis center authorized by Chinese Government..

The assay method is X-ray fluorescence Spectrometry, according the “GB/T18043-2000 Precious Metal Jewellery Content Non-damaged Test Method – X-Ray Fluorescence  Spectrometry” and GB/T16921-1997 Measurement of Metallic Coating Thickness X-Ray Spectrometric Method”.

All GoldArt products come with the Certification of Analysis.

It is guaranteed made of >99.0% pure gold. The gold thickness of GoldArt card is 0.12µm.                    

                

Certification of Analysis: GoldArt Card Batch 119104,
Gold Content 99.4%, Thicknessof Gold 0.12 µm                  

                                                                    

X-ray Fluorescence (XRF)

According World Gold Council, the assay methods of gold jewelry,  "X-ray fluorescence (XRF) is a non-destructive technique that is suitable for normal assaying requirements such as in-house quality control in manufacturing or for 'certifying' gold content".

With recent advances in x-ray spectrometry and new software it is becoming one of the best instruments for the analysis of any archaeological material,  art museums, to examine the materials composition of pigments in paintings etc.

 A typical x-ray fluorescence system consists of three components: 
1. an excitation source, which can be either x-ray tubes or radioisotopes such as 109Cd; 
2. a detector (such as lithium drifted silicon or high purity germanium) and its associated electronics; 
3.) a pulse height analyzer and computer for analyzing the fluorescent spectrum and displaying it if desired. The system can be programmed to automatically flag the presence of materials of interest, such as toxic heavy metals. 


The sample is irradiated by an intense x-ray beam, which causes the emission of fluorescent x-rays. 
The emitted x-rays can either be detected using energy dispersive or wavelength dispersive detector. 
Either the energies or wavelengths of the emitted x-rays are used to identify the elements present in the sample while the concentrations of the elements are determined by the intensity of the x-rays.

XRF is particular suitable for thin  metal layer analysis, with the depth of sample analyzed varying from less than 1 mm to 1 cm depending on the energy of the emitted x-ray and the sample composition. Its accuracy reached 0.2 - 0.5%.

21CEC is the comprehensive supplier of GoldArt brand na,e products worldwide. 

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